Inventors

Title of the Invention

Patent No.

Approved Date

1

Hybrid six-degree-of-freedom nano-scale precision positioning platform system 

TWI425334

2014/02/01

2

Signal measurement system with dual grating 

TWI414756

2013/11/11

3

Manufacturing-process equipment

US8575791 B2

2013/11/5

4

Nanoscale piezoelectric alignment platform mechanism with two degrees of freedom 

TWI410295

2013/10/01

5

Spherical lens testing device for precision machine 

TWI404910

2013/08/11

6

Laser direct-writing type manufacturing apparatus for nano periodic structure pattern 

TWI405049

2013/08/11

7

Dynamic path detection method for five-axis machine tool and device thereof. 

TWI405057

2013/08/11

8

Device for detecting multi-axis errors of pick-and-place mechanism by utilizing split beam 

TWI401420

2013/07/11

9

Apparatus applied to pick-and-place mechanism positioning and angle error of single light source inspection and testing

TWI401554

2013/07/11

10

Device and method of using laser interferometer for detecting angle error

TWI398622

2013/06/11

11

Straightness error measurement device 

TWI398877

2013/06/11

12

Framework for measuring thickness and refraction index of transparent substrate 

TWI390174

2013/03/21

13

Device for measuring linear frictional resistance 

TWI390198

2013/03/21

14

Device for measuring the error of pick-up mechanism by using split light beam and dynamic sensor 

TWI388030

2013/03/01

15

Non-contact measurement method for thread shape of lead screw and screw nut and its device

TWI385355

2013/02/11

16

Device of applying a single light source to detect dual axis errors of a pick-and-place mechanism

TWI384196

2013/02/01

17

Device and method of using laser light source for scanning scrapped surface 

TWI383125

2013/01/21

18

Measurement system for alignment and level adjustment of embossing platform 

TWI383466

2013/01/21

19

Detecting assembly for a multi-axis machine tool

EP2340914 B1

2012/12/26

20

Two stage type long stroke nano-scale precision positioning system. 

TWI379732

2012/12/21

21

Measurement device for multi-axis machine tool. 

2012/12/11

22

Optical ruler system having five degrees of freedom 

TWI414747

2012/11/16

23

A contactless vibration measurement device 

TWI372857

2012/09/21

24

Static torque measurement device for linear motion unit 

TWI361886

2012/04/11

25

Method of detecting a dynamic path of a five-axis machine tool and detecting assembly for the same

US8116902 B2

2012/2/14

26

Automatic scan and mark apparatus

US8111405 B2

2012/2/7

Parallel measuring apparatus among transparent body and reflection body and method thereof 

TWI345624

2011/07/21

Five-axis tool machine detection device

TWI340679

2011/04/21

29

Detecting assembly for a multi-axis machine tool

US7852478 B1

2010/12/14

30

Means for measuring a working machine's structural deviation from five reference axes

US7773234 B2

2010/8/10

31

System for detecting error of multi-axis processing machine and method thereof 

TWI326630

2010/07/01

Parallelism measurement device for movements on linear slide-rail 

TWI326746

2010/07/01

33

Device for sensing positioning error of pick-and-place mechanism by applying dynamic sensor

TW201012607

2010/04/01

34

A thickness measuring system with astigmatic method for transparent and semi-transparent objects 

TWI318681

2009/12/21

35

Heat dissipation seat 

TWI315781

2009/10/11

36

All-electric nanoscale imprinter 

TWI312730

2009/08/01

37

Static/dynamic multi-function measuring device for linear unit

US7636170 B1

2008/9/12

38

A nano-grade 3-DOF micro platform mechanism

TWI300733

2008/09/11

39

3-DOF Z-tilts nano-platform and its measuring system

TW20060148762

2008/7/7

40

A system for detecting errors of a one-dimensional five degrees of freedom(DOF) system 

TWI292816

2008/01/21

41

Non-contact bidirectional laser probe 

TWI292817

2008/01/21

42

A system for detecting errors of a one-dimensional five degrees of freedom(DOF) system 

TWI292816

2008/01/21

43

Non-contact bidirectional laser probe 

TWI292817

2008/01/21

44

Mechanism to eliminate the backlash of servo motor 

M324344

2007/12/21

45

Nano-scaled error-inspecting system of rotary shafts 

M323050

2007/12/01

46

Highly precise two-stage triangulation laser con-focal probe 

TWI290211

2007/11/21

Aligning mechanism 

M321342

2007/11/01

48

Vibration measuring system with two axes and six degree of freedom 

TWI287613

2007/10/01

49

System and method is used with theory of optical aberration for measuring free camber 

TWI287614

2007/10/01

50

Measuring error method for high precision and nano-scale rotation axis and the apparatus thereof 

TWI287616

2007/10/01

51

Testing method of the straightness error using double-beam laser diffraction meter and the system thereof

TWI287617

2007/10/01

52

4 drive alignment platform 

M319503

2007/09/21

53

High precision rotation revolving thermal deformation measurement system 

TWI285254

2007/08/11

54

Device for measuring rotation axis error using cat's-eye reflector

TWI283736

2007/07/11

55

Optical measurement unit for real-time measuring angular error of platform and the method thereof 

TWI274139

2007/02/21

56

Tri-axis vibration measuring device adopting cube corner prism and quadrant sensor to establish nano-resolution 

TWI271513

2007/01/21

Dual-axis and five degree-of-freedom measuring device and method 

TWI263036

2006/10/01

58

Error-measuring apparatus for nano-scale rotary axis

TWI260394

2006/08/21

A real time straightness error measuring method for a moving stage

200617364

2006/06/01

Diffractive positioning 5-degree of freedom measuring device that uses optical interference and diffractive theories 

TWI249609

2006/02/21

Diffractive angle positioning multi-degree of freedom measuring device 

TWI249610

2006/02/21

62

Optical revolving spindle error measurement device 

TWI247095

2006/01/11

63

Device for measuring linear dual axis geometric tolerances 

I245878

2005/12/21

64

Diffraction-type triangular laser pickup head and error inspection method thereof 

TWI243888

2005/11/21

65

A kind of apparatus using transmission grating to measure rotation axis errors 

TWI239385

2005/09/11

66

Device for measuring on a 2D plane with optical ruler measuring technique combined with atomic force probe 

TWI235228

2005/07/01

67

Miniature arbor revolving precision measurement device 

TWI235233

2005/07/01

68

Optical real-time measurement method and system with single-axis, 6 degrees of freedom 

TWI232923

2005/05/21

69

A three-dimensional measuring system for vibration and displacement using quadrant detector and laser diode

TWI231365

2005/04/21

70

A device and method of reflective diffraction grating measure revolving spindle 

TWI220688

2004/09/01

71

System capable of measuring five degrees of freedom signals 

591199

2004/06/11

72

Simplified glass thickness measurement system 

591203

2004/06/11

73

A 3D measuring system using diffraction grating interfere interferometry technique 

588152

2004/05/21

74

Ring grating type rotational axis measurement system with 5 degrees of freedom 

585988

2004/05/01

75

Measurement system with 6 degrees of freedom by 2D optical rule 

201878

2004/05/01

76

Measurement system with four degrees of freedom built through the optical grating diffraction principle 

201880

2004/05/01

77

Method using a grid encoder to detect error of platform of six-degree of freedom 

201367

2004/04/21